 |
X-ray source
With a voltage of from 25kV up to a maximum 225 kV, the XT H 225 is suited for as both general-purpose use, such as plastics, PCB's, light alloys, small assemblies and organic or biological samples, as heavier castings, welds and high-density alloys.
Target
The micro-focus spot gives very high resolution and is the recommended standard target. Rod anodes are ideal for single wall inspection of hollow samples, such as pipe welds.
5-axis sample manipulator
The XT H 225 has 3 linear axes and 2 rotational axes, to view the sample at any angle. The 10kg manipulator holds most sample weight to manipulate with the highest precision. The manipulator is normally controlled by variable speed joysticks. It can also be program controlled via the rack-mounted industrial PC.
X-ray image flat panel detectors
The wide choice of flat panels allows a good match for subject size and x-ray energy and provide optimum choice for sample size, field of view, and magnification requirements.
High magnification
As the sample is moved towards the x-ray source, the geometric magnification continuously increases from approximately 1X (close to the intensifier window) to 160X (touching the x-ray source).
Image processing
General NDT applications usually need the standard functions, such as contrast enhancement, image integration and background subtraction. Special functions, such as automatic die attach void and wire sweep calculations, graphic displays and colour enhancement are available for more critical analysis.
Reliability
The continuously pumped all metal x-ray tube eliminates the problems of costly failures and long replacement times of sealed glass tubes. Customer maintenance is minimal, typically requiring filament changes taking 15-minute replacement time.
System features
- 5 µm Focal Spot Reflection Target X-Ray Source, 25 to 225 kV, 0 to 2000 µA (non continuous) 60 or 225 Watt.
- 10kg Capacity 5 axis fully programmable manipulator.
- Maximum scan area 250 x 330mm.
- Geometric Magnification up to: 160x.
- System Magnification up to: 400x.
- Feature recognition: down to 1 micron.
- External Cabinet Dimensions: 2030mm L, 925mm D, 2000mm H.
- Full system control and image processing software.
|
|
|
Product brochures
Industrial X-ray and Computed Tomography
Latest news
06/01/2009
Metris and Renishaw announce agreement on the licensing of Camio
18/12/2008
Metris Laser Radar automates accurate inspection of hole features for aerospace applications
20/11/2008
Metris integrates SpecMetrix coating thickness measurement in iSpace
Contact us
|
|
