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Products > X-ray and CT inspection > Electronics inspection > Processing performance


Interactive and user-friendly software is essential in evaluating the complex internal structure of samples and performing accurate inspection. The software tools provide all the means to guide you in retrieving the required information, using the most advanced visualization and analysis capabilities. Developed to streamline the process of inspection and measurement, Metris Inspect-X software runs first-article inspection in minutes, instead of hours or days.


Real time X-ray inspection

  • Interactive joystick control for intuitive part positioning
  • Lock in on BGA or Region on Interest (ROI)
  • Ultra-fast acquisition of X-ray scans
  • Integrated display and analysis tools
  • Measure on screen & annotate data

Image analysis/ enhancement

  • User-configurable multipoint tone adjust
  • Image processing filters  (sharpen, smooth, edge detect, emboss, background subtract, etc)
  • Inspection tools (e.g. BGA void recognition)
  • Image histogram

Maximum productivity
  •  Component specific automated pass/fail analysis
  •  Redo analysis on off-line visualization station
  •  Parameter locking organizes operator and supervisor rights
  •  Macro-based automation requires no programming skills
  •  Automatic HTML report generation
  •  VBA (Visual Basic for Applications) ready to automate complex tasks

Integrated CT acquisition

  • Easy-to-use data collection
  • 3D volume reconstruction function
  • CT data ready for  industry standard post-processing applications


Processing performance

Processing performance Lock in on BGA or Region on Interest

Processing performance
BGA void analysis using Smart filter 

Processing performance


Product brochures

Electronics inspection


Latest news

06/01/2009
Metris and Renishaw announce agreement on the licensing of Camio

18/12/2008
Metris Laser Radar automates accurate inspection of hole features for aerospace applications

20/11/2008
Metris integrates SpecMetrix coating thickness measurement in iSpace


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