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The XT V 160, also known as the Revolution, has been developed utilizing X-Tek’s 20 years experience in nanofocus X-ray technology.
The system provides the highest resolution and magnification possible within a compact system and is ideally suited for inspection of electronic components in production lines and failure analysis laboratories.
The XT V 160 is a versatile tool that allows an operator to easily make use of the system’s manual and programmable inspection capabilities. On top of it is ready for Computed Tomography CT inspection to reconstruct the test sample in full 3D image.
Designed for 100% BGA and µBGA inspection, multilayer board inspection and PCB solder joint inspection, it is a simple to use, high resolution and cost-effective inspection solution that is an indispensable workhorse for any inspection lab.
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XT V 160 inspection benefits
- Intuitive to use
- High quality images in a short time
- Market leading magnification for 100% board inspection
- 75 degree oblique viewing (an amazing 15 degrees to the plane of board).
- Low cost-of-ownership
- Safety as a design criterion
- Small footprint
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Case studies
X-ray inspection of electronics at PartnerTech
More
Product brochures
Electronics inspection
Latest news
20/11/2008
Metris integrates SpecMetrix coating measurement
18/11/2008
Metris 08Q3 trading update
23/10/2008
Metris Inspect-X 1.5 streamlines CT data collection and analysis
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