 |
Non-contact scanning integrating laser probes
Laser scanning is a well-established technology that is available on Metris LK CMMs due to advances in design, miniaturization and the use of lightweight materials. It removes many restrictions of traditional contact measurement probes.
Today, laser scanning enables complete modeling and inspection of complex freeform, multi-filleted or featured parts. Due to its non-contact nature, laser scanning is also perfectly suited for measuring flexible or fragile materials, which often present severe challenges for touch probes due to the risk of indentations or surface scratches. Metris laser scanners are designed to operate on the LK CMM using Camio Studio and through the Renishaw PH10M and multiwire, which results in plug and play integration without additional wiring.
LK CMMs are particularly suitable for laser scanning due to their advanced controller technology. The Metris probes acquire data at the rate of 19200 points per second, producing a dense, highly accurate pointcloud of the part. As such, the time needed to measure complex parts reduces from hours or days to minutes.
|
|
|
|
|
Case studies
Metris 3D Laser Scanning
Product brochures
CMM
Latest news
30/06/2008
Metris acquires CMM software company Integrated Quality Inc.
11/06/2008
Metris receives Best Performer sales growth award
19/05/2008
H1 2008 trading update: progressing as planned,confirming 2008 outlook
Upcoming events
Jul 15-17
SemiCon
San Francisco, CA, US
Jul 21-25
CMSC
Charlotte, NC, US
Sept 8-13
IMTS
Chicago, IL, US
More events
|
|
